November 10, 2010 article A Program Disturb Model and Channel Leakage Current Study for Sub-20 nm nand Flash Cells IEEE Transactions on Electron Devices DOI: 10.1109/ted.2010.2087338 OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 53 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Spherical Harmonics Expansion and Multi-Scale Modeling 2022 Springer handbooks book-chapter Engineering Advancements in Semiconductor Devices and Circuit Design 2 citations 1 result References 0