April 01, 1992 article 'Border traps' in MOS devices IEEE Transactions on Nuclear Science DOI: 10.1109/23.277495 OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 367 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Flexible p-Type WSe2 Transistors with Alumina Top-Gate Dielectric 2024 ACS Applied Materials & Interfaces article Materials Science 2D Materials and Applications Open access 6 citations Variability and high temperature reliability of graphene field-effect transistors with thin epitaxial CaF2 insulators 2024 npj 2D Materials and Applications article Materials Science Graphene research and applications Open access 13 citations Insulators for 2D nanoelectronics: the gap to bridge 2020 Nature Communications article Materials Science 2D Materials and Applications Open access cited by 3 patents 561 citations 3 results References 0