June 11, 2014 conference-paper Open access How flat is your detector? Non-uniform annular detector sensitivity in STEM quantification Journal of Physics Conference Series DOI: 10.1088/1742-6596/522/1/012018 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 19 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si 2020 Ultramicroscopy article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications 9 citations 1 result References 0