January 01, 1996 article Open access High-Density Layer at the SiO2/Si Interface Observed by Difference X-Ray Reflectivity Japanese Journal of Applied Physics DOI: 10.1143/jjap.35.l67 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 1 stored of 80 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access X-ray reflectivity from micrometre-scaled surfaces using nanobeams 2025 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access 1 citations 1 result References 0