November 01, 2011 conference-paper On Defect Oriented Testing for Hybrid CMOS/Memristor Memory DOI: 10.1109/ats.2011.66 OpenAlex Authors 0 Author list not loaded yet. Cited by 5 stored of 80 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Background 2025 Synthesis lectures on engineering, science, and technology book-chapter Engineering Advanced Memory and Neural Computing 0 citations Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs 2024 IEEE Latin American Test Symposium (LATS) conference-paper Computer Science VLSI and Analog Circuit Testing 2 citations A DfT Strategy for Detecting Emerging Faults in RRAMs 2022 IFIP advances in information and communication technology conference-paper Computer Science VLSI and Analog Circuit Testing Open access 3 citations Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs 2021 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science VLSI and Analog Circuit Testing cited by 5 patents 14 citations Review of Manufacturing Process Defects and Their Effects on Memristive Devices 2021 Journal of Electronic Testing article Engineering Advanced Memory and Neural Computing Open access 33 citations 5 results References 0