November 24, 2013 article Study of vertical Si/SiO2 interface using laser-assisted atom probe tomography and transmission electron microscopy Micron DOI: 10.1016/j.micron.2013.11.003 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 27 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access A Quantitative Investigation of Functionalized Glazing Stacks by Atom Probe Tomography 2022 Advanced Materials Technologies article Engineering Advanced Materials Characterization Techniques Open access 4 citations Correlative microscopy and techniques with atom probe tomography: Opportunities in materials science 2022 MRS Bulletin article Engineering Advanced Materials Characterization Techniques Open access 15 citations 2 results References 0