January 31, 2014 article RRAM Defect Modeling and Failure Analysis Based on March Test and a Novel Squeeze-Search Scheme IEEE Transactions on Computers DOI: 10.1109/tc.2014.12 OpenAlex Authors 0 Author list not loaded yet. Cited by 3 stored of 262 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Background 2025 Synthesis lectures on engineering, science, and technology book-chapter Engineering Advanced Memory and Neural Computing 0 citations A DfT Strategy for Detecting Emerging Faults in RRAMs 2022 IFIP advances in information and communication technology conference-paper Computer Science VLSI and Analog Circuit Testing Open access 3 citations Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs 2021 IFIP/IEEE International Conference on Very Large Scale Integration conference-paper Computer Science VLSI and Analog Circuit Testing cited by 5 patents 14 citations 3 results References 0