June 06, 2014 article Electrical stability of multilayer MoS2 field-effect transistor under negative bias stress at various temperatures physica status solidi (RRL) - Rapid Research Letters DOI: 10.1002/pssr.201409146 OpenAlex Authors 0 Author list not loaded yet. Cited by 2 stored of 44 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Improving stability in two-dimensional transistors with amorphous gate oxides by Fermi-level tuning 2022 Nature Electronics article Materials Science Graphene research and applications Open access 140 citations Insulators for 2D nanoelectronics: the gap to bridge 2020 Nature Communications article Materials Science 2D Materials and Applications Open access cited by 3 patents 561 citations 2 results References 0