October 26, 2005 book Thin Film Analysis by X‐Ray Scattering Wiley eBooks DOI: 10.1002/3527607595 OpenAlex Authors 0 Author list not loaded yet. Cited by 7 stored of 1,017 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors 2024 Journal of Applied Crystallography article Materials Science X-ray Diffraction in Crystallography Open access 7 citations The influence of microstructural orientation on fracture toughness in (V, Al)N and (V, Al)(O, N) coatings as measured by microcantilever bending 2023 Journal of materials research/Pratt's guide to venture capital sources article Engineering Metal and Thin Film Mechanics Open access 10 citations Numerical and experimental studies on crack nucleation and propagation in thin films 2023 International Journal of Mechanical Sciences article Engineering Numerical methods in engineering 12 citations Precipitation-based grain boundary design alters Inter- to Trans-granular Fracture in AlCrN Thin Films 2022 Acta Materialia article Engineering Metal and Thin Film Mechanics Open access 38 citations Highly-oriented proton conducting BaZr0.9Y0.1O3−x ceramic thin films prepared by chemical solution deposition 2022 Journal of the European Ceramic Society article Materials Science Advancements in Solid Oxide Fuel Cells 6 citations Probing the onset of wurtzite phase formation in (V,Al)N thin films by transmission electron microscopy and atom probe tomography 2022 Surface and Coatings Technology article Physics and Astronomy GaN-based semiconductor devices and materials Open access 20 citations Orientation dependence of the fracture mechanisms in (V,Al)N coatings determined by micropillar compression 2022 Journal of materials research/Pratt's guide to venture capital sources article Engineering Metal and Thin Film Mechanics Open access cited by 1 patent 4 citations 7 results References 0