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DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images
2022 Nanomanufacturing and Metrology article Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access

Hongchu Du

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Correction: DMPFIT: A Tool for Atomic-Scale Metrology via Nonlinear Least-Squares Fitting of Peaks in Atomic-Resolution TEM Images
2022 Nanomanufacturing and Metrology erratum Biochemistry, Genetics and Molecular Biology Advanced Electron Microscopy Techniques and Applications Open access

Hongchu Du

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Hongchu Du 2,528 citations overall
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