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(Invited) Application of 3D in-Situ X-Ray Visualization to Track the Formation of Dislocation Clusters during PVT Growth of SiC2023 ECS Meeting Abstracts conference-abstract Engineering Silicon Carbide Semiconductor Technologies
Peter J. Wellmann, Sven Strüber, Johannes Steiner, Jonas Ihle, Binh Duong Nguyen, Stefan Sandfeld, +2 more
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