Papers matching “semiconductor manufacturing quality control” 2
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An Annotation-Efficient Parallel Processing Framework for Robust Defect Detection in TFT-LCD Manufacturing2026 Results in Engineering article Engineering Industrial Vision Systems and Defect Detection Open access
Muhammad Irshad, Poorya Khanali, Sameed Sajid, Martin Wanly, Susanna Weber, Benny Drescher, +2 more
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