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Papers matching “scanning electron microscopy images” in Image and Object Detection Techniques 1

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Comparative Analysis of Canny and Watershed Edge Detection for Line-Edge Roughness (LER) Quantification in SEM Images
2025 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) conference-paper Computer Science Image and Object Detection Techniques

Shuyan He, Michail Michailow, Yufeng Jin

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