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Utilizing the Switching Stochasticity of HfO2/TiOx-Based ReRAM Devices and the Concept of Multiple Device Synapses for the Classification of Overlapping and Noisy Patterns
Christopher Bengel, Felix Cüppers, Melika Payvand, Regina Dittmann, Rainer M. Waser, Susanne Hoffmann‐Eifert, +1 more
35citations
5 results