Papers matching “electron backscatter diffraction” in Chalcogenide Semiconductor Thin Films 3
Not finding it? Sign in to also search OpenAlex live.
-
Correlative APT/EBIC/EBSD show grain boundaries with different traits have different composition2020 Conference record of the IEEE Photovoltaic Specialists Conference conference-paper Engineering Chalcogenide Semiconductor Thin Films
Mohit Raghuwanshi, Jens Keutgen, Roland Wüerz, Oana Cojocaru‐Mirédin
0citations
3 results