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(Invited) Application of 3D in-Situ X-Ray Visualization to Track the Formation of Dislocation Clusters during PVT Growth of SiC2023 ECS Meeting Abstracts conference-abstract Engineering Silicon Carbide Semiconductor Technologies
Peter J. Wellmann, Sven Strüber, Johannes Steiner, Jonas Ihle, Binh Duong Nguyen, Stefan Sandfeld, +2 more
0citations -
Unravelling the Interplay between Degradation and Impedance through Physical Modeling – a White Box Approach2025 ECS Meeting Abstracts conference-abstract Materials Science Advancements in Solid Oxide Fuel Cells
Marisa Knappe, Thomas Kadyk, Andrei A. Kulikovsky, Michael Hermann Eikerling
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Sparse Electrochemical Impedance Spectroscopy Measurements during Solid Oxide Cell Stack Operation Based on Power Supply2025 ECS Meeting Abstracts conference-abstract Materials Science Advancements in Solid Oxide Fuel Cells Open access
Christian Mänken, Dominik Schäfer, Remzi Can Samsun, Rüdiger‐A. Eichel
0citations
9 results