Papers matching “automatic test pattern generation” 3
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The Impact of Logic Locking on Confidentiality: An Automated Evaluation2025 International Symposium on Quality Electronic Design (ISQED) conference-paper Computer Science Physical Unclonable Functions (PUFs) and Hardware Security Open access
Lennart M. Reimann, Evgenii Rezunov, Dominik Germek, Luca Collini, Christian Pilato, Ramesh Karri, +1 more
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