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SPARSE — Efficient high-resolution SEM imaging of rare microstructural features across large areas by selective rescanning2026 Materials Characterization article Materials Science Electron and X-Ray Spectroscopy Techniques Open access
Tom Reclik, Jan Gerlach, Maximilian A. Wollenweber, Yannis P. Korkolis, Sandra Korte‐Kerzel, U. Kerzel
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