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A tomographic workflow to enable deep learning for X-ray based foreign object detection2022 Expert Systems with Applications article Engineering Industrial Vision Systems and Defect Detection Open access cited by 1 patent
Mathé T. Zeegers, Tristan van Leeuwen, Daniël M. Pelt, Sophia Bethany Coban, Robert van Liere, Kees Joost Batenburg
6citations
8 results