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LogicAD: Explainable Anomaly Detection via VLM-based Text Feature Extraction2025 Proceedings of the AAAI Conference on Artificial Intelligence conference-paper Engineering Industrial Vision Systems and Defect Detection Open access
Yongli Mou, Gerhard Lakemeyer, Stefan Decker, Oliver Simons, Johannes Stegmaier
20citations -
A Formal Approach to Defining Effects of Manufacturing Functions2024 IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) conference-paper Engineering Digital Transformation in Industry
Jürgen Bock, Tobias Klausmann, Tobias Kleinert, Aljosha Köcher, Marco Simon, Michael Winter
5citations -
Unambiguous Interpretation of IEC 60848 GRAFCET based on a Literature Review2023 IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) conference-paper Engineering Industrial Automation and Control Systems Open access
Robin Mroß, Aron Schnakenbeck, Marcus Völker, Alexander Fay, Stefan Kowalewski
4citations -
Experimental Data and Evaluation Materials for "An Execution-Aware Evaluation Architecture for AI-Agent Orchestration of Long-Horizon Mobile Manipulation in a Flexible Assembly Environment"2026 Zenodo (CERN European Organization for Nuclear Research) dataset Engineering Robot Manipulation and Learning Open access
Lucas Manassés Pinheiro de Souza, Karthik Mohan, Tiago Sant'Ana, Lukas Bergs, Alexander Moriz, Robert Heinrich Schmitt
0citations -
Experimental Data and Evaluation Materials for "An Execution-Aware Evaluation Architecture for AI-Agent Orchestration of Long-Horizon Mobile Manipulation in a Flexible Assembly Environment"2026 Zenodo (CERN European Organization for Nuclear Research) dataset Engineering Robot Manipulation and Learning Open access
Lucas Manassés Pinheiro de Souza, Karthik Mohan, Tiago Sant'Ana, Lukas Bergs, Alexander Moriz, Robert Heinrich Schmitt
0citations -
Towards Supporting Non-Destructive Testing Inspectors with a Multi-Modal Generative AI Copilot2026 e-Journal of Nondestructive Testing article Engineering Non-Destructive Testing Techniques Open access
Pia Carina Pickmann, Jan-Henrik Woltersmann, Jonas Werheid, Hannes Behnen, Sylwia Olbrych, Jörg Weißer, +3 more
0citations