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Microscopic origins of electron trapping in amorphous silicon nitride ( a -Si 3 N 4 ) and its role in charge-trap flash memory2026 Journal of Physics Condensed Matter review Engineering Semiconductor materials and devices Open access
Christoph Wilhelmer, Lukas Hückmann, Jonathon P. Cottom, Dominic Waldhoer, Jörg Meyer, Tibor Grasser
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