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Sub-percent Characterization and Polarimetric Performance Analysis of Commercial Micro-polarizer Array Detectors2024 arXiv (Cornell University) preprint Engineering Optical Polarization and Ellipsometry Open access
Thijs A. Stockmans, Naor Scheinowitz, Erwoud van der Linden, Irina Malysheva, Kira N. Strelow, Martijn Smit, +1 more
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A structural analysis of ordered Cs$_{3}$Sb films grown on single crystal graphene and silicon carbide substrates2024 arXiv (Cornell University) preprint Engineering Photocathodes and Microchannel Plates Open access
Charles H. Pennington, Mengjia Gaowei, Elena Echeverría, Kenneth Evans‐Lutterodt, Alice Galdi, Thomas Juffmann, +7 more
0citations