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Advancements in supervised deep learning for metal artifact reduction in computed tomography: A systematic review2024 European Journal of Radiology review Engineering Advanced X-ray and CT Imaging Open access cited by 1 patent
Cecile E J Kleber, Ramez Karius, Lucas E Naessens, Coen O Van Toledo, Jochen A. C. van Osch, Martijn F. Boomsma, +2 more
20citations
2 results