A Aralex Aachen research explorer

Search

From

To

Institution

Field

Type

Open access only Cited by patents (Lens) Include non-Aachen papers (citing/cited)

Papers matching “depth profiling” 1

Sort: Relevance Cited Newest Oldest Fwci Patents ⇩ CSV

Not finding it? Sign in to also search OpenAlex live.

Optimizing ToF-SIMS Depth Profiles of Semiconductor Heterostructures
2024 arXiv (Cornell University) preprint Engineering Ion-surface interactions and analysis Open access

Jan Tröger, Reinhard Kersting, Birgit Hagenhoff, Dominique Bougeard, Nikolay V. Abrosimov, Jan Klos, +2 more

0

citations

1 result