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Brightness, Colour, Polarisation: A Multi-Instrument Observation Campaign of the Gorizont-6 Satellite2026 Lancaster EPrints (Lancaster University) article Engineering Space Satellite Systems and Control Open access
R. Airey, Paul Robin Brian Chote, Klaas Wiersema, Ioannis Apergis, James McCormac, James A. Blake, +12 more
0citations -
Evaluating the Quality of Lane Change Event Detection: Effect of Situational Variables2022 International Conference on Vehicle Technology and Intelligent Transport Systems (VEHITS) conference-paper Engineering Autonomous Vehicle Technology and Safety Open access
Merlijne Geurts, J.H. Hogema, Emilia Silvaş, Jan L. Souman, Ashfaqur Rahman, Johannes Hiller
2citations -
Sub-percent Characterization and Polarimetric Performance Analysis of Commercial Micro-polarizer Array Detectors2024 arXiv (Cornell University) preprint Engineering Optical Polarization and Ellipsometry Open access
Thijs A. Stockmans, Naor Scheinowitz, Erwoud van der Linden, Irina Malysheva, Kira N. Strelow, Martijn Smit, +1 more
0citations -
Recycling‐Induced Copper Contamination of a 42CrMo4 Quench and Tempering Steel: Alterations in Transformation Behavior and Mechanical Properties2022 steel research international article Engineering Microstructure and Mechanical Properties of Steels Open access
Alexander Gramlich, Torben Hinrichs, Hauke Springer, Ulrich Krupp
26citations -
Breaking the passivity wall of metals: Exempli gratia non-aqueous Ti–air battery2023 Chemical Engineering Journal article Engineering Advanced battery technologies research Open access
Yasin Emre Durmus, Marcel Kaltenberg, Krzysztof Dzięcioł, Maximilian Schalenbach, Danny M. Gelman, Boris Shvartsev, +4 more
7citations -
Natural H2 from Sedimentary Organic Matter: is It All It is Cracked up to be?2024 EAGE Annual Conference & Exhibition conference-paper Engineering Hydrocarbon exploration and reservoir analysis
B. Horsfield, Susanne Nelskamp, Victoria F. Sachse, Marta Sośnicka, Christopher J. Boreham, N. Mahlstedt, +1 more
3citations -
(Invited) Application of 3D in-Situ X-Ray Visualization to Track the Formation of Dislocation Clusters during PVT Growth of SiC2023 ECS Meeting Abstracts conference-abstract Engineering Silicon Carbide Semiconductor Technologies
Peter J. Wellmann, Sven Strüber, Johannes Steiner, Jonas Ihle, Binh Duong Nguyen, Stefan Sandfeld, +2 more
0citations