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Processing of Keyhole Depth Measurement Data during Laser Beam Micro Welding2020 Proceedings of the Institution of Mechanical Engineers Part L Journal of Materials Design and Applications article Computer Science Optical measurement and interference techniques cited by 1 patent
Sören Hollatz, Marc Hummel, Lea Jaklen, Wiktor Lipnicki, Alexander M. Olowinsky, Arnold Gillner
7citations
5 results