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Surface Quality Monitoring and Improvement for Dimensional Metrology in Inline CT by Denoising with Neural Networks and Fast Surface Quality Metric2025 e-Journal of Nondestructive Testing article Computer Science Image and Signal Denoising Methods Open access
Ahmed Baraka, César Cardona-Marin, Steffen Kieß, Dominik Wolfschläger, Robert Heinrich Schmitt, Sven Simon
0citations -
Accelerating Deep Learning Inference in Constrained Embedded Devices Using Hardware Loops and a Dot Product Unit2020 IEEE Access article Computer Science Parallel Computing and Optimization Techniques Open access cited by 1 patent
Jure Vreča, Karl J. X. Sturm, Ernest Gungl, Farhad Merchant, Paolo Bientinesi, Rainer Leupers, +1 more
17citations
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