A Aralex Aachen research explorer

Search

From

To

Institution

Field

Type

Open access only Cited by patents (Lens) Include non-Aachen papers (citing/cited)

Papers matching “interface defects” 1

Sort: Relevance Cited Newest Oldest Fwci Patents ⇩ CSV

Not finding it? Sign in to also search OpenAlex live.

( Keynote ) What Can We Learn by Measuring Δ R s and Δ R v of Electrochemical Reactions?
2025 ECS Meeting Abstracts conference-abstract Chemistry Electrochemical Analysis and Applications

Rolf Schuster, Laurin Derr, Marco Schönig

0

citations

1 result