Simulating the BKT Transition

Cambridge University Press eBooks, pp. 293–299

Abstract

This chapter shows the dynamics of long-range order melting by the proliferation of topological defects, in the context of the two-dimensional XY model. It introduces numerical methods for studying such transitions and guides the numerical measurement and analysis of indicators for long-range order.

Authors 3

1. Aron J. Beekman
   Affiliation as printed

   Sioux Technologies

2. Louk Rademaker Aachen

   Leiden University · University of Geneva

   Affiliation as printed

   University of Geneva and Leiden University

3. Jasper van Wezel

   University of Amsterdam

   Affiliation as printed

   University of Amsterdam