An Annotation-Efficient Parallel Processing Frameworkfor Robust Defect Detection in TFT-LCD Manufacturing

SSRN Electronic Journal

Authors 7

1. Muhammad Irshad

   Hong Kong Polytechnic University

   Affiliation as printed

   Hong Kong Polytechnic University, Hung Hom, Kowloon, Kowloon, Hong Kong

2. Poorya Khanali
3. Sameed Sajid
4. Martin Wanly Aachen

   RWTH Aachen University

   Affiliation as printed

   RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany

5. Susanna Weber Aachen

   RWTH Aachen University

   Affiliation as printed

   RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany

6. Benny Drescher
7. ASM Ashraf Mahmud corresponding

   University of the West of Scotland

   Affiliation as printed

   University of the West of Scotland, Paisley High Street, PA1 2BE, Paisley, PA1 2BE, United Kingdom