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January 01, 2026 article Open access Aachen paper

SPARSE — Efficient high-resolution SEM imaging of rare microstructural features across large areas by selective rescanning

Materials Characterization

DOI: 10.18154/rwth-2026-07561 Full text (OA) OpenAlex

Authors 6

  1. Tom Reclik Aachen

    RWTH Aachen University

    Affiliation as printed

    RWTH Aachen

  2. Jan Gerlach
  3. Maximilian Aeneas Wollenweber Aachen

    RWTH Aachen University

    Affiliation as printed

    RWTH Aachen

  4. Yannis P. Korkolis
  5. Sandra Korte‐Kerzel Aachen

    RWTH Aachen University

    Affiliation as printed

    RWTH Aachen

  6. Ulrich Bernd Kerzel Aachen

    RWTH Aachen University

    Affiliation as printed

    RWTH Aachen

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