July 20, 2026 article Open access Defects with a negative correlation energy as memory traps in a flash memory. An illusion? Materials Science and Engineering B DOI: 10.1016/j.mseb.2026.119704 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 3 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Switchable Chemical‐Bond Reorganization for the Stable Charge Trapping in Amorphous Silicon Nitride 2023 Advanced Materials article Engineering Semiconductor materials and devices Open access 17 citations Intrinsic Charge Trapping and Reversible Charge Induced Structural Modifications in a‐Si 3 N 4 2023 Advanced Physics Research article Engineering Semiconductor materials and devices Open access 11 citations Anderson’s negative- U chemistry in amorphous silicon nitride: A complex system approach 2025 Science Advances article Engineering Semiconductor materials and devices Open access 6 citations 3 results