June 30, 2026 article Semi-supervised YOLO-DEP for high-resolution X-ray component localization and counting Journal of X-Ray Science and Technology DOI: 10.1177/08953996261439069 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Quantifying the effect of X-ray scattering for data generation in real-time defect detection 2024 Journal of X-Ray Science and Technology article Engineering Non-Destructive Testing Techniques Open access 3 citations 1 result