June 05, 2026 article A single multi-configuration direct electron detector for various electron imaging and diffraction-based techniques in SEM Ultramicroscopy DOI: 10.1016/j.ultramic.2026.114405 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Comparison of Kikuchi diffraction geometries in the scanning electron microscope 2025 Materials Characterization article Engineering Advanced Materials Characterization Techniques Open access 12 citations 1 result