March 22, 2026 conference-paper Single-Step Dead Time Optimization Based on Gate-Source Voltage Sensing IEEE Applied Power Electronics Conference and Exposition (APEC) DOI: 10.1109/apec51134.2026.11517081 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access A Fully Integrated Adaptive Dead-Time Controlling Gate Driver Enabling ZVS in HV Converters 2023 Proceedings of ESSCIRC conference-paper Engineering Advanced DC-DC Converters 3 citations 1 result