April 28, 2026 article A Multi-Bit CMOS Characterization Platform for One-Million Resistive Switching Devices IEEE Transactions on Circuits and Systems I Regular Papers DOI: 10.1109/tcsi.2026.3680429 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 3 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Standards for the Characterization of Endurance in Resistive Switching Devices 2021 ACS Nano article Engineering Advanced Memory and Neural Computing Open access 265 citations A Fully Automated Platform for Evaluating ReRAM Crossbars 2024 IEEE Latin American Test Symposium (LATS) conference-paper Engineering Advanced Memory and Neural Computing 7 citations Work-in-Progress: A Universal Instrumentation Platform for Non-Volatile Memories 2023 International Conference on Hardware/Software Codesign and System Synthesis conference-paper Engineering Advanced Memory and Neural Computing Open access 5 citations 3 results