Scale correction in submicron computed tomography with a submillimeter field of view

Tomography of Materials and Structures

Authors 6

1. Marek Zemek
2. Pavel Blažek Aachen

   RWTH Aachen University

   Affiliation as printed

   RWTH Aachen

3. Jakub Šalplachta
4. Tomáš Zikmund
5. Michal Petřík
6. Jozef Kaiser