March 29, 2026 article Open access When Are Capacitance–Voltage, Drive‐Level Capacitance Profiling, and Fast‐CV Actually Insensitive to Interface and Bulk Defects? Solar RRL DOI: 10.1002/solr.202500779 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 2 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Fingerprints Indicating Superior Properties of Internal Interfaces in Cu(In,Ga)Se2 Thin‐Film Solar Cells 2022 Advanced Materials article Engineering Chalcogenide Semiconductor Thin Films Open access 27 citations A simulation study on the effect of sodium on grain boundary passivation in CIGS thin-film solar cells 2021 Conference record of the IEEE Photovoltaic Specialists Conference conference-paper Engineering Chalcogenide Semiconductor Thin Films 4 citations 2 results