RAPIDviewer : an ImageJ script for visualization and analysis of indexed electron diffraction patterns of cubic materials

Journal of Applied Crystallography, vol. 59, pp. 673–677

Abstract

RAPIDviewer is a newly developed ImageJ macro script that addresses the limitations of the indexing program RAPID (which enables the indexing of zone-axis electron diffraction patterns from cubic materials) by generating graphical overlays on the experimental patterns, including configurable spot and Kikuchi line drawings. Additional features include orientation sketches, inverse-pole-figure markers and an option for VESTA file export. Examples utilizing selected-area electron diffraction patterns from an austenitic steel, an M 23 C 6 precipitate and an aluminium alloy illustrate the features of the program.

Authors 1

1. Thomas E. Weirich corresponding Aachen Gemeinschaftslabor für Elektronenmikroskopie (GFE)

   RWTH Aachen University

   Affiliation as printed

   Gemeinschaftslabor für Elektronenmikroskopie (GFE) RWTH Aachen University Ahornstrasse 55 52074Aachen Germany