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November 20, 2025 conference-paper

Integrating AI Agents with Classical Reliability Assessment via LLMs of Semiconductor Lasers

International Conference on System Reliability and Safety Engineering (SRSE)

DOI: 10.1109/srse67406.2025.11357401 OpenAlex

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References 2

Multiphysics analysis of chip and resonator designs for increased damage threshold of external cavity high-power laser diodes
2023 Optics Express article Engineering Semiconductor Lasers and Optical Devices Open access

10

citations
Effective Sample Size for the Kaplan-Meier Estimator: A Valuable Measure of Uncertainty?
2025 The American Statistician article Mathematics Probability and Statistical Research Open access

4

citations

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