W6684139912

• Evaluating On-State Voltage and Junction Temperature Monitoring Concepts for Wide-Bandgap Semiconductor Devices

  2022 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies Open access

  11

  citations
• Online Junction-Temperature Extraction Method for SiC MOSFETs Utilizing Turn-on Delay

  2021 IEEE Workshop on Wide Bandgap Power Devices and Applications conference-paper Engineering Silicon Carbide Semiconductor Technologies cited by 1 patent

  9

  citations
• Intelligent Monitoring and Maintenance Technology for Next-Generation Power Electronic Systems

  2021 IEEE Journal of Emerging and Selected Topics in Power Electronics article Engineering Reliability and Maintenance Optimization cited by 3 patents

  21

  citations
• Online Junction Temperature Monitoring of Power Semiconductor Devices Based on a Wheatstone Bridge

  2021 IEEE Energy Conversion Congress and Exposition (ECCE) conference-paper Engineering Silicon Carbide Semiconductor Technologies Open access

  9

  citations
• Reviewing Thermal-Monitoring Techniques for Smart Power Modules

  2021 IEEE Journal of Emerging and Selected Topics in Power Electronics article Engineering Silicon Carbide Semiconductor Technologies cited by 1 patent

  78

  citations
• Real-Time Monitoring of Thermal Response and Life-Time Varying Parameters in Power Modules

  2020 IEEE Transactions on Industry Applications article Engineering Silicon Carbide Semiconductor Technologies

  49

  citations

6 results