January 01, 2025 article Open access A Hybrid CNN-SVM Algorithm for Detecting Manufacturing Defects IEEE Access DOI: 10.1109/access.2025.3630968 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Improving Model Accuracy for Imbalanced Image Classification Tasks by Adding a Final Batch Normalization Layer: An Empirical Study 2021 Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition conference-paper Computer Science Advanced Neural Network Applications Open access cited by 1 patent 8 citations 1 result