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September 24, 2025 conference-paper

Simplified Thermal Transient Testing: Unlocking Affordable, Open-Source Solutions

International Workshop on Thermal Investigations of ICs and Systems

DOI: 10.1109/therminic65879.2025.11216930 OpenAlex

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A Sparsity-Promoting Time Domain Evaluation Method for Thermal Transient Measurement of Power Semiconductors
2024 IEEE Transactions on Power Electronics article Engineering Silicon Carbide Semiconductor Technologies Open access cited by 1 patent

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