Distribution analysis in xCT data for identifying factors influencing uncertainty of repeated measurements
e-Journal of Nondestructive Testing, vol. 30
Abstract
X-ray computed tomography (xCT) enables the measurement of inner and outer dimensional quantities by reconstructing the 3D model of an object. Due to limited understanding of the xCT acquisition and reconstruction processes modern guidelines typically estimate the measurement uncertainty using a standardized procedure based on repeated measurements and basic statistical analysis. In this work, we analyze voxel-wise distributions in the reconstructed volume and identifyclusters that reveal factors influencing measurement uncertainty in repeated measurements, with the eventual goal of reducing the number of CT scans required for accurate uncertainty estimation.
Authors 3
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Lionel Kielhöfer Aachen IQS Intelligence in Quality Sensing Laboratory for Machine Tools and Production Engineering WZL
Affiliation as printed
IQS Intelligence in Quality Sensing , Laboratory for Machine Tools and Production Engineering WZL , RWTH Aachen University , Campus-Boulevard 30 , 52074 Aachen , Germany
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Dominik Wolfschläger Aachen IQS Intelligence in Quality Sensing Laboratory for Machine Tools and Production Engineering WZL
Affiliation as printed
IQS Intelligence in Quality Sensing , Laboratory for Machine Tools and Production Engineering WZL , RWTH Aachen University , Campus-Boulevard 30 , 52074 Aachen , Germany
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Robert Heinrich Schmitt Aachen Fraunhofer Institute for Production Technology IPT IQS Intelligence in Quality Sensing Laboratory for Machine Tools and Production Engineering WZL
RWTH Aachen University · Fraunhofer Institute for Production Technology IPT
Affiliation as printed
Fraunhofer Institute for Production Technology IPT , Steinbachstrasse 17 , 52074 Aachen , Germany
IQS Intelligence in Quality Sensing , Laboratory for Machine Tools and Production Engineering WZL , RWTH Aachen University , Campus-Boulevard 30 , 52074 Aachen , Germany
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