January 27, 2025 conference-paper A contact resistance extraction method for GFETs based on transfer curves at different drain biases Spanish Conference on Electron Devices DOI: 10.1109/cde66381.2025.11038891 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 4 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Graphene‐Based Microwave Circuits: A Review 2021 Advanced Materials article Materials Science Graphene research and applications Open access 79 citations Dependable Contact Related Parameter Extraction in Graphene–Metal Junctions 2020 Advanced Electronic Materials article Materials Science Graphene research and applications Open access 31 citations Dependable Contact Related Parameter Extraction in Graphene–Metal Junctions 2020 RWTH Publications (RWTH Aachen) article Materials Science Graphene research and applications Open access 20 citations Multi-Project Wafer Runs for Electronic Graphene Devices in the European Project “2D-Experimental Pilot Line” 2024 Research Square preprint Materials Science Graphene research and applications Open access 2 citations 4 results