Accurate and robust methods for direct background estimation in resonant anomaly detection
Physical review. D/Physical review. D., vol. 111
Abstract
Resonant anomaly detection methods have great potential for enhancing the sensitivity of traditional bump hunt searches. A key component of these methods is a high quality background template used to produce an anomaly score. Using the LHC Olympics R&D dataset, we demonstrate that this background template can also be repurposed to directly estimate the background expectation in a simple cut and count setup. In contrast to a traditional bump hunt, no fit to the invariant mass distribution is needed, thereby avoiding the potential problem of background sculpting. Furthermore, direct background estimation allows working with large background rejection rates, where resonant anomaly detection methods typically show their greatest improvement in significance.
Authors 7
-
Ranit Das corresponding
Rutgers, The State University of New Jersey
Affiliation as printed
Rutgers University
NHETC, Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854, USA
-
Affiliation as printed
RWTH Aachen University
Institute for Theoretical Particle Physics and Cosmology, RWTH Aachen University, D-52056 Aachen, Germany
-
Affiliation as printed
RWTH Aachen University
Institute for Theoretical Particle Physics and Cosmology, RWTH Aachen University, D-52056 Aachen, Germany
-
Affiliation as printed
Center for Data and Computing in Natural Sciences (CDCS)
Universität Hamburg
-
Affiliation as printed
RWTH Aachen University
Institute for Theoretical Particle Physics and Cosmology, RWTH Aachen University, D-52056 Aachen, Germany
-
Affiliation as printed
RWTH Aachen University
Institute for Theoretical Particle Physics and Cosmology, RWTH Aachen University, D-52056 Aachen, Germany
-
David Shih corresponding
Rutgers, The State University of New Jersey
Affiliation as printed
Rutgers University
NHETC, Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854, USA
Cited by 2 stored of 1
2 results
No patents citing this paper on Lens.org (checked 2026-10-06).