May 01, 2025 article Open access High‐Throughput Optical Identification and Statistical Analysis of Atomically Thin Semiconductors Advanced Optical Materials DOI: 10.1002/adom.202500150 Full text (OA) OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 2 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access An open-source robust machine learning platform for real-time detection and classification of 2D material flakes 2024 Machine Learning Science and Technology article Engineering Industrial Vision Systems and Defect Detection Open access 25 citations 1 result