November 18, 2024 conference-paper Multidimensional Characterization of Temperature Sensitive Electrical Parameters in SiC Mosfets using Automation of Measurement Data Analysis IEEE Design Methodologies Conference (DMC) DOI: 10.1109/dmc62632.2024.10812155 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 1 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Sensitivity Analysis Method of Temperature-Dependent Parameters During Turn-on Process of SiC Power MOSFETs 2022 IEEE Annual Southern Power Electronics Conference conference-paper Engineering Silicon Carbide Semiconductor Technologies 5 citations 1 result