High Precision Correlative Analysis of Dielectric Behavior Evolution and Anisotropy in Graphene Oxide Thin Film as a Function of Thermal Annealing Parameters
Authors 14
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Hesam Amiri Aachen
Affiliation as printed
RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany
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Aidin Nikookhesal Aachen
Affiliation as printed
RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany
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Divagar Murugan Aachen
Affiliation as printed
RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany
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M. Frentzen Aachen
Affiliation as printed
RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany
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Yuan Cao Aachen
Affiliation as printed
RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany
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Affiliation as printed
Free University of Berlin
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Helmholtz Association of German Research Centres · Federal Institute For Materials Research and Testing
Affiliation as printed
Helmholtz Association of German Research Centres - BAM Federal Institute for Materials Research and Testing
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Helmholtz Association of German Research Centres · Federal Institute For Materials Research and Testing
Affiliation as printed
Helmholtz Association of German Research Centres - BAM Federal Institute for Materials Research and Testing, Berlin Office, Anna-Louisa-Karsch-Straße 2, Berlin, DE 10178, Germany
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Xuan Thang Vu Aachen
Affiliation as printed
RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany
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Joachim Knoch Aachen
Affiliation as printed
RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany
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Sven Ingebrandt Aachen
Affiliation as printed
RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany
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Affiliation as printed
Lorestan University, Iran
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Affiliation as printed
RWTH Aachen University, Templergraben 55, 52056 Aachen, 52056, Germany
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