November 03, 2024 conference-paper Cross-Layer Reliability Evaluation of In-Memory Similarity Computation DOI: 10.1109/itc51657.2024.00024 OpenAlex Authors 0 Author list not loaded yet. Cited by 0 stored of 0 References 2 Search Sort Most cited Newest Oldest Patent citations Title Any typearticle review book-chapter conference-paper preprint dissertation book dataset other Any fieldAgricultural and Biological Sciences Arts and Humanities Biochemistry, Genetics and Molecular Biology Business, Management and Accounting Chemical Engineering Chemistry Computer Science Decision Sciences Dentistry Earth and Planetary Sciences Economics, Econometrics and Finance Energy Engineering Environmental Science Health Professions Immunology and Microbiology Materials Science Mathematics Medicine Neuroscience Nursing Pharmacology, Toxicology and Pharmaceutics Physics and Astronomy Psychology Social Sciences Veterinary Open access Variability-Aware Modeling of Filamentary Oxide-Based Bipolar Resistive Switching Cells Using SPICE Level Compact Models 2020 IEEE Transactions on Circuits and Systems I Regular Papers article Engineering Advanced Memory and Neural Computing Open access 139 citations HRS Instability in Oxide-Based Bipolar Resistive Switching Cells 2020 IEEE Transactions on Electron Devices article Engineering Advanced Memory and Neural Computing 57 citations 2 results